Caracterización de materiales a través de medidas de microscopía electrónica de barrido (SEM)

Josué Clavijo

Resumen


La microscopía de barrido electrónico (SEM) es una técnica de obtención de imágenes ampliamente utilizada en investigación de materiales debido a su alta resolución y capacidades de analizar características morfológicas, estructurales y químicas de las muestras bajo estudio. En este documento revisamos los fundamentos tanto conceptuales como de funcionamiento y utilidad de las imágenes que resultan de una medida de SEM, relacionando todo con el material más usado en fotocatálisis eterogénea, el ióxido de titanio (TiO2).

Palabras clave


SEM; photocatalysis; image analysis; TiO2

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DOI: http://dx.doi.org/10.15765/e.v3i3.420

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